Rozwiązania i Komponenty dla AutomatykiSolutions and Components for Automation

Temperature mapping system

We present the temperature mapping, supported by I-SCAN ™

Texcan has expanded the I -SCAN ™ platform with a new temperature mapping function using thin -layer temperature sensors, enabling the recording of a detailed temperature distribution on the surface - or between two surfaces, where thermal imaging cameras are not able to do it.

This innovative solution integrates I-SCAN software and electronics with a thin-layer temperature sensor, ensuring precise high-resolution thermal analysis in an easy-to-use format. The sensor can be used alone or, depending on the selected package, in combination with the Texcan pressure mapping sensor - enabling the collection of thermal and/or pressure data to obtain a deeper view of the product performance and process optimization.

The most important benefits

Measurement where thermal imaging cameras cannot cope

Accurate temperature measurement in moving components, closed spaces and multilayer materials - even inside closed machines and rotating rollers, where infrared cameras fail. Regardless of whether you work with closed machines, rotating equipment or multi -layered teams, the Texcan temperature detection system provides dynamic, spatial insight into thermal behavior in real time.

insensitive to emission

Unlike infrared cameras, which require emission adjustment to obtain accurate readings, sensors for mapping TEXCAN temperature provide precise, direct measurements regardless of the properties of the material.

visualization of heat spread

Specify how the heat moves through the surface and indicate the critical area to optimize the product design, selection of materials and process control.         

Comprehensive insight into data

Real time recording temperature distribution on high resolution surface for a deeper analysis.

Improvement of data collection

Eliminate the embarrassing use of many thermocounts on the surface for many measuring points (192) contained in one trimmed sensor.

Correlation of pressure and temperature

I-scan pressure overlay to reveal the critical relationship between pressure and temperature affecting product performance and reliability.

Smooth integration with i-scan

He works with the existing I-SCAN 9.5 platform, enabling easy adaptation for users already familiar with Texcan pressure mapping technology.

 

Temperature mapping system technology

CzujnikiElektronikaOprogramowanie
czujnik temperatury TekscanTekscan Evolution uchwytoprograowanie Tekscan
  • Thin, flexible and easy to trim: the new T800 temperature sensor ensures direct contact with the surface to accurately mapping the temperature in high resolution.
  • High resolution: sensor with 192 measuring points in the 16x12 system in the range of 0-120 ° C.
  • Measurement of temperature in tight places - unlike thermal imaging cameras, works in closed, covered or reflective environments, making it ideal for complex applications.
  • He works with existing equipment: designed to cooperate with the Texcan Evolution handle.
  • Simple connection: The data is captured and transferred to the software on the computer using a USB cable.
  • Double application: A single system works with both a temperature sensor and pressure or a second device can be added to use both at the same time.
  • Real time - visualization displays dynamic temperature distribution maps both in live mode and in recording mode for detailed analysis.
  • Simultaneous mapping of temperature and pressure - after turning on this function, users can map, compare and correlate the temperature and pressure distribution on the surface.
  • Comparison of pressure and temperature trends in time allows you to discover critical correlations in material behavior and process efficiency.

 

Temperature mapping software

I-SCAN software for temperature mapping provides mapping and visualization of real-time temperature for a deeper analysis. Created on the I-SCAN 9.5 platform, TEXCAN offers configurable heat maps, improved calibration and intuitive tools for efficient and accurate data analysis.

Wykres oprogramowania czujnika temperatury w czasie

software properties

  • Simultaneous mapping of temperature and pressure: after starting, users can map, compare and correlate the temperature and pressure distribution on the surface.
  • Real -time temperature visualization: displays dynamic temperature distribution maps both in real and registered mode for detailed analysis.
  • Chart and application of pressure and temperature: Comparison of pressure and temperature trends to discover critical correlations in material behavior and process efficiency.
  • Easy to use interface: It works on Texcan i-SCAN 9.5 software, ensuring a known and easy-to-use work flow for current users.
  • Unique temperature gradient scale: provides non -standard heat maps to improve the visualization and analysis of thermal data.
  • Improved calibration procedure: provides accurate, repetitive measurements thanks to the intuitive configuration process. *(laboratory heating plates available for calibration as an optional accessory)

 

application

Energy storage

Analysis of temperature distribution in cells, modules and battery packages during charging /discharge cycles to identify hot points.
Assessment of the effectiveness of insulation layers in temperature management

Packing and production
    
 Verification of heat homogeneity in welding strips during the machine configuration to ensure consistent welds in packaging applications.
 Measurement of constant temperature in pressure rollers in laminating and processing processes.

Automotive

Assessment of thermal shield performance to optimize thermal protection in vehicles.
Assessment of electronic heating systems in electric vehicles in terms of efficient climate control in the cabin.
Monitoring of heat dissipation in engines and components operating at high temperatures.

Electronics and semiconductors

Measurement of heat dissipation efficiency between components and heat sinks.
Assessment of uniformity of temperature during the production of semiconductor tiles in terms of semiconductor reliability.

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