Rozwiązania i Komponenty dla AutomatykiSolutions and Components for Automation
»Sensors and measurement devices»Non-contact position and displacement measurement»interferometers»IMS5400-DS White Light Inteferometer

IMS5400-DS White Light Inteferometer

The new IMS5400-DS white light interferometer opens up new possibilities in industrial distance measurements.

The controller has an intelligent evaluation function and enables absolute measurements down to nanometers with a relatively large offset. Compared to other absolute optical measurement systems, the IMS5400-DS offers an unrivaled combination of accuracy, measurement range and offset.

Properties:

  • Distance measurements with nanometer accuracy
  • Absolute measurement, suitable for step profiles
  • Compact and durable sensors with large offset
  • Frequency up to 6 kHz for high-speed measurements
  • Ethernet, EtherCAT, RS422
  • Solid controller with passive cooling
  • Easy configuration via web interface

Absolute distance measurement with sub-nanometer resolution

TheIMS5400-DS is used for very precise displacement and distance measurements. Unlike conventional interferometers, theIMS5400-DS also enables stable measurement of step profiles. Thanks to absolute measurement, degree scanning is performed with high signal stability and precision. When measuring on moving objects, differences in high tilts, steps and depressions can thus be reliably detected.

Ideal for industrial environments

Robust sensors and a controller in a metal housing make the system ideal for integration into production lines. The controller can be mounted in a control cabinet via DIN rail mounting and provides very stable measurement results thanks to active temperature compensation and passive cooling.

Thesecompact sensorstake up extremely little space and can also be integrated in confined spaces. Highly flexible fiber optic cables are available in lengths up to 10 m and allow separation of the sensor and controller. Start-up and parameterization are conveniently done via the web interface and do not require software installation.

Small light spot for detecting the smallest details and structures

The sensors generate a small light spot over the entire measurement range. The light spot diameter is only 10 µm and allows the detection of fine details such as structures on semiconductors and miniaturized electronic components.

Multi-surface measurement
Interferometryczna metoda pomiarowa umożliwia pomiary na wielu powierzchniach. Pozwala to na bardzo precyzyjne pomiary odległości na metalach odbijających światło, tworzywach sztucznych i szkle.

 

 

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